X-ray diffraction using focused-ion-beam-prepared single crystals 
14 April 2020

Tina Weigel, Claudia Funke, Matthias Zschornak, Thomas Behm, Hartmut Stöcker, Tilmann Leisegang and Dirk C. Meyer X-ray diffraction using focused-ion-beam-prepared single crystals. Journal of Applied Crystallography, 2020, 53 (3). doi: 10.1107/S1600576720003143 IF 3.527

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